SUBSTITUTES
Alternative producers in overlapping segments/subsegments — ranked by lower chokepoint score. Sanctioned peers sink to the bottom.
Applied Materials
Keys: equipment front end · equipment front end/deposition · equipment front end/etch · equipment front end/ion implant · equipment front end/metrology inspection · equipment front end/cmp planarization
| Candidate | Country | Score | Verdict | Overlap | |
|---|---|---|---|---|---|
| Veeco Instruments | United States | 26 | CLEAR | equipment front end/deposition | Compare › |
| Bruker | United States | 26 | CLEAR | equipment front end/metrology inspection | Compare › |
| ClassOne Technology | United States | 26 | CLEAR | equipment front end/deposition | Compare › |
| Plasma-Therm | United States | 27 | CLEAR | equipment front end/etch | Compare › |
| Axcelis Technologies | United States | 30 | CLEAR | equipment front end/ion implant | Compare › |
| Onto Innovation | United States | 30 | CLEAR | equipment front end/metrology inspection | Compare › |
| JEOL | Japan | 31 | CLEAR | equipment front end/metrology inspection | Compare › |
| Eugene Technology | South Korea | 31 | CLEAR | equipment front end/deposition | Compare › |
| Oxford Instruments | United Kingdom | 31 | CLEAR | equipment front end/etch, equipment front end/deposition | Compare › |
| PSK Inc | South Korea | 31 | CLEAR | equipment front end/etch | Compare › |
| Sumitomo Heavy Industries | Japan | 31 | CLEAR | equipment front end/ion implant | Compare › |
| Park Systems | South Korea | 31 | CLEAR | equipment front end/metrology inspection | Compare › |